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cve[email protected]CVE-2018-5210
HistoryJan 04, 2018 - 6:29 a.m.

CVE-2018-5210

2018-01-0406:29:00
CWE-787
web.nvd.nist.gov
17
samsung
mobile devices
trustlet
stack overflow
tee
code execution
vulnerability
security
attack
sve-2017-10733
nvd

9.3 High

CVSS2

Attack Vector

NETWORK

Attack Complexity

MEDIUM

Authentication

NONE

Confidentiality Impact

COMPLETE

Integrity Impact

COMPLETE

Availability Impact

COMPLETE

AV:N/AC:M/Au:N/C:C/I:C/A:C

8.1 High

CVSS3

Attack Vector

NETWORK

Attack Complexity

HIGH

Privileges Required

NONE

User Interaction

NONE

Scope

UNCHANGED

Confidentiality Impact

HIGH

Integrity Impact

HIGH

Availability Impact

HIGH

CVSS:3.0/AV:N/AC:H/PR:N/UI:N/S:U/C:H/I:H/A:H

8.2 High

AI Score

Confidence

High

0.002 Low

EPSS

Percentile

56.0%

On Samsung mobile devices with N(7.x) software and Exynos chipsets, attackers can conduct a Trustlet stack overflow attack for arbitrary TEE code execution, in conjunction with a brute-force attack to discover unlock information (PIN, password, or pattern). The Samsung ID is SVE-2017-10733.

Affected configurations

NVD
Node
samsungsamsung_mobileMatch7.0
OR
samsungsamsung_mobileMatch7.1
OR
samsungsamsung_mobileMatch7.1.1
OR
samsungsamsung_mobileMatch7.1.2

9.3 High

CVSS2

Attack Vector

NETWORK

Attack Complexity

MEDIUM

Authentication

NONE

Confidentiality Impact

COMPLETE

Integrity Impact

COMPLETE

Availability Impact

COMPLETE

AV:N/AC:M/Au:N/C:C/I:C/A:C

8.1 High

CVSS3

Attack Vector

NETWORK

Attack Complexity

HIGH

Privileges Required

NONE

User Interaction

NONE

Scope

UNCHANGED

Confidentiality Impact

HIGH

Integrity Impact

HIGH

Availability Impact

HIGH

CVSS:3.0/AV:N/AC:H/PR:N/UI:N/S:U/C:H/I:H/A:H

8.2 High

AI Score

Confidence

High

0.002 Low

EPSS

Percentile

56.0%

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