CVE-2018-13888

2019-02-1115:00:00

qualcomm

www.cve.org

0.0004 Low

EPSS

Percentile

12.6%

JSON

There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.

CNA Affected

[
  {
    "product": "Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables",
    "vendor": "Qualcomm, Inc.",
    "versions": [
      {
        "status": "affected",
        "version": "MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605"
      }
    ]
  }
]

References

www.securityfocus.com/bid/106475

www.qualcomm.com/company/product-security/bulletins

0.0004 Low

EPSS

Percentile

12.6%

JSON

Related for CVELIST:CVE-2018-13888